Measurement of complex permittivity and permeability of dielectric materials placed on a substrate

Abstract

A broad-band technique for making simultaneous frequency measurements of complex permittivity and permeability of dielectric materials placed on a known substrate is described. The characteristics of these dielectric materials are evaluated from two-port scattering parameter measurements of a stripline cell, by using a microwave vector network analyser. Study of the sensitivity of the calculated permittivity and permeability as a function of the measurement errors is included.