A new technique for the measurement of the complex permittivity of dielectrie substrates using a dielectric resonator is reported. This method is a non-contact measurement using two dielectric resonators which support TE mode. This paper describes some examples of measurements.
Toshio NishikawaK. WakinoHiroaki TanakaYouhei Ishikawa
Giuseppe GalloneP. LucardesiMassimo MartinelliP. A. Rolla