JOURNAL ARTICLE
Dielectric Resonator Method for Nondestructive Measurement of Complex Permittivity of Microwave Dielectric Substrates
Toshio NishikawaK. WakinoHiroaki TanakaYouhei Ishikawa
Year: 1990 Vol: mtt 33 Pages: 501-506
Abstract
A new technique for the measurement of the complex permittivity of dielectric substrates was developed. This method is a non-contact measurement using two dielectric resonators which support the TE016 mode. The complex permittivity is analyzed using finite element method. The nondestructive measurement of located small area in a dielectric substrate can be achieved. This paper describes some examples of measurement.
Keywords:
Permittivity Dielectric Materials science Microwave Resonator Dielectric resonator Nondestructive testing Relative permittivity Electronic engineering Optoelectronics Computer science Telecommunications Engineering Physics
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3
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0.43
FWCI (Field Weighted Citation Impact)
2
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0.68
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Topics
Microwave Dielectric Ceramics Synthesis
Physical Sciences → Engineering → Electrical and Electronic Engineering
Microwave and Dielectric Measurement Techniques
Physical Sciences → Engineering → Electrical and Electronic Engineering
Acoustic Wave Resonator Technologies
Physical Sciences → Engineering → Biomedical Engineering
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