Photoemission (UPS and XPS) study of local structures of amorphous GeTe and GeSe films

T. Takahashi; Takasi Sagawa

doi:10.1016/0022-3093(83)90310-1

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Photoemission (UPS and XPS) study of local structures of amorphous GeTe and GeSe films

T. Takahashi Takasi Sagawa

Year: 1983 Journal: Journal of Non-Crystalline Solids Vol: 59-60 Pages: 879-882 Publisher: Elsevier BV

DOI: 10.1016/0022-3093(83)90310-1

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Keywords:

X-ray photoelectron spectroscopy Amorphous solid Materials science Annealing (glass) Crystallization Photoemission spectroscopy Substrate (aquarium) Thin film Chemical engineering Crystallography Analytical Chemistry (journal) Nanotechnology Composite material Chemistry Organic chemistry

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Glass properties and applications

Physical Sciences → Materials Science → Ceramics and Composites

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Photoemission (UPS and XPS) study of local structures of amorphous GeTe and GeSe films

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