Photoemission (UPS and XPS) study of crystallization of amorphous GeTe film

T. Takahashi; Hitoshi Sakurai; Takahiro Sagawa

doi:10.1016/0038-1098(82)90592-0

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Photoemission (UPS and XPS) study of crystallization of amorphous GeTe film

T. Takahashi Hitoshi Sakurai Takahiro Sagawa

Year: 1982 Journal: Solid State Communications Vol: 44 (5)Pages: 723-726 Publisher: Elsevier BV

DOI: 10.1016/0038-1098(82)90592-0

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Keywords:

Amorphous solid X-ray photoelectron spectroscopy Crystallization Annealing (glass) Materials science Photoemission spectroscopy Thin film Substrate (aquarium) Crystallography Analytical Chemistry (journal) Chemical engineering Nanotechnology Chemistry Metallurgy

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Glass properties and applications

Physical Sciences → Materials Science → Ceramics and Composites

Photoemission (UPS and XPS) study of crystallization of amorphous GeTe film

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