Year: 2006 Journal: The International Journal of Advanced Manufacturing Technology Vol: 31 (5-6)Pages: 501-508 Publisher: Springer Science+Business Media
Materials science Sputtering Focused ion beam Tungsten carbide Scanning electron microscope Surface roughness Grinding Microfabrication Surface micromachining Optoelectronics Composite material Nanotechnology Ion Thin film Fabrication
Metrics
42
Cited By
1.68
FWCI (Field Weighted Citation Impact)
19
Refs
0.85
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Advanced Machining and Optimization Techniques
Physical Sciences → Engineering → Electrical and Electronic Engineering