Characterization of annealed pulsed laser deposited (PLD) thin films of cesium oxythiomolybdate (Cs2MoOS3)

Karla L Strong; J.S. Zabinski

doi:10.1016/s0040-6090(01)01743-6

ScienceGate Book Chapters

JOURNAL ARTICLE

Characterization of annealed pulsed laser deposited (PLD) thin films of cesium oxythiomolybdate (Cs2MoOS3)

Karla L Strong J.S. Zabinski

Year: 2002 Journal: Thin Solid Films Vol: 406 (1-2)Pages: 164-173 Publisher: Elsevier BV

DOI: 10.1016/s0040-6090(01)01743-6

Get Full-Text PDF Get Analytical Report

Keywords:

Inconel Materials science Silicon nitride Pulsed laser deposition Thin film Annealing (glass) Nitride Silicon Caesium Chemical engineering Lubricant Analytical Chemistry (journal) Metallurgy Inorganic chemistry Nanotechnology Chemistry Composite material Organic chemistry

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.11

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Metal and Thin Film Mechanics

Physical Sciences → Engineering → Mechanics of Materials

Lubricants and Their Additives

Physical Sciences → Engineering → Mechanical Engineering

Diamond and Carbon-based Materials Research

Physical Sciences → Materials Science → Materials Chemistry

Characterization of annealed pulsed laser deposited (PLD) thin films of cesium oxythiomolybdate (Cs2MoOS3)

Metrics

Citation History

Topics

Related Documents

Tribology of pulsed laser deposited thin films of cesium oxythiomolybdate (Cs2MoOS3)

Characterization of Post - Annealed PZT Thin Films Deposited Using Pulsed Laser Ablation

Synthesis, structural and electrical properties of annealed ZnO thin films deposited by pulsed laser deposition (PLD)

Optical characterization of thin silicon films deposited by CVD and annealed by pulsed laser

Structural Characterization of Pulsed Laser Deposited Ktn Thin Films