Structural Characterization of Pulsed Laser Deposited Ktn Thin Films

A. A. Savvinov; I. G. Siny; Ram S. Katiyar; M. Pumarol; H. Abou Mourad; Félix E. Fernández

doi:10.1557/proc-541-747

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Structural Characterization of Pulsed Laser Deposited Ktn Thin Films

A. A. Savvinov I. G. Siny Ram S. Katiyar M. Pumarol H. Abou Mourad Félix E. Fernández

Year: 1998 Journal: MRS Proceedings Vol: 541 Publisher: Cambridge University Press

DOI: 10.1557/proc-541-747

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Keywords:

Materials science Tantalate Thin film Pulsed laser deposition Dielectric Raman spectroscopy Ferroelectricity Perovskite (structure) Raman scattering Analytical Chemistry (journal) Optoelectronics Optics Crystallography Nanotechnology

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Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Perovskite Materials and Applications

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave Dielectric Ceramics Synthesis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Structural Characterization of Pulsed Laser Deposited Ktn Thin Films

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