Printed Circuit Board Evaluation by Holographic Interferometry

D. S. Lo

doi:10.1063/1.1685474

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Printed Circuit Board Evaluation by Holographic Interferometry

D. S. Lo

Year: 1972 Journal: Review of Scientific Instruments Vol: 43 (10)Pages: 1498-1500 Publisher: American Institute of Physics

DOI: 10.1063/1.1685474

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Abstract

Application of real time holographic interferometry for the examination of a printed circuit board is described. The procedures and the resulting holographic interferograms of two specific studies are presented: (1) The heat conduction of a spacer used for mounting transistors on a heat sink, and (2) the detection of inner layer short circuits on a multilayer printed circuit board.

Keywords:

Printed circuit board Interferometry Holography Heat sink Materials science Holographic interferometry Electronic circuit Transistor Optics Thermal conduction Optoelectronics Electrical engineering Physics Voltage Composite material Engineering

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Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Optical measurement and interference techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Digital Holography and Microscopy

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Printed Circuit Board Evaluation by Holographic Interferometry

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