Nondestructive testing of printed circuit board by phase-shifting interferometry

Abstract

In the paper, the principle of phase shifting interferometry has been briefly described. B using this technique to the non-destructive testing of solder joints on printed circuit board, the defective solder joints can be easily distinguished b the phase changes on the joints. A suitable aglorithm for the processing of the interferogram was also given. Keywords: Holographic interferometry, Non-destructive testing Phase-sh I ft