JOURNAL ARTICLE
Holographic interferometry: identification of circuit board component failure
Year: 1976 Journal: Applied Optics Vol: 15 (1)Pages: 24-24 Publisher: Optica Publishing Group
Abstract
Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text James R. Crawford and Robert Benson, "Holographic interferometry: identification of circuit board component failure," Appl. Opt. 15, 24-25 (1976) Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article
Keywords:
Citation Component (thermodynamics) Holography Identification (biology) Computer science Holographic interferometry Interferometry Optics Editorial board Physics World Wide Web Library science
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0.53
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0
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0.74
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Citation History
Topics
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences → Engineering → Electrical and Electronic Engineering
Surface Roughness and Optical Measurements
Physical Sciences → Engineering → Computational Mechanics
Near-Field Optical Microscopy
Physical Sciences → Engineering → Biomedical Engineering
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