This paper describes the measurement and modeling of gate capacitance for self-aligned, LDD GaAs EFETs and DFETs. An improved, scalable gate capacitance model is presented which is suitable for compact device simulation.
Carlos NavarroJ. M. ZamanilloA. MediavillaA. Taz�nJ. L. Garc�a
Carlos NavarroJ. M. ZamanilloA. MediavillaAntonio Tazón PuenteJ.L. Garcı́aMauro Matías Lomer BarbozaJosé Miguel López Higuera
M.A. TischlerD.C. La TulipeT.F. KuechJ.H. MagerleinH.J. Hovel
M. A. TischlerD. LaTulipeT. F. KuechJ. H. MagerleinH.J. Hovel