MuhammadAtif Khan (4790037)Servin Rathi (1552414)Dongsuk Lim (1552423)Sun Jin Yun (3699646)Doo-Hyeb Youn (4318222)Kenji Watanabe (75040)Takashi Taniguchi (331592)Gil-Ho Kim (1552426)
The\noperation of a self-biased diode (SBD) based on MoS<sub>2</sub> has\nbeen demonstrated by using an asymmetric top gate comprising\nmetal-hexagonal boron nitride (h-BN)-MoS<sub>2</sub> structure. The\nrectification is achieved by asymmetric modulation of effective Schottky\nbarrier and carrier density in the channel during forward and reverse\nbias, and a rectification factor of 1.3 × 10<sup>5</sup> is achieved\nin <i>I–V</i> characteristics. The modulation of\neffective Schottky barrier is verified by temperature dependent measurement\nin a range of 173 to 373 K, and a difference of 300 meV is observed\nin effective Schottky barrier height for forward and reverse bias.\nThe electrical characteristics of SBD exhibit close resemblance with\nan ideal thermionic emission model with an ideality factor of 1.3.\nSBD also exhibits strong photoelectrical response with a specific\ndetectivity of 150 A/W and responsivity of 2.1 × 10<sup>10</sup> Jones under 450 nm laser light illumination. In the end, to demonstrate\nthe diversity of the proposed scheme, SBD based on WSe<sub>2</sub> has also been fabricated and the results have been discussed. These\nresults suggest a new route toward the SBD based numerous electronics\nand optoelectronics applications and can in principle be implemented\nusing other two-dimensional materials as well.
Weijie Zhao (1427515)R. M. Ribeiro (1886395)Minglin Toh (1823854)Alexandra Carvalho (1501945)Christian Kloc (1473742)A. H. Castro Neto (1501951)Goki Eda (1400284)
Arnulf Jäger‐WaldauMartha Ch. Lux‐SteinerErnst Bucher
Hao-Ling Tang (4356250)Ming-Hui Chiu (1344651)Chien-Chih Tseng (1731457)Shih-Hsien Yang (709937)Kuan-Jhih Hou (4636714)Sung-Yen Wei (4636711)Jing-Kai Huang (1424881)Yen-Fu Lin (1579705)Chen-Hsin Lien (4636717)Lain-Jong Li (1344654)
Chiara Massera (547887)Gernot Frenking (1569796)
Werner E. van ZylJosé M. López‐de‐LuzuriagaJohn P. FacklerRichard J. Staples