Scanning Electrochemical Cell Microscopy Platform\nwith Local Electrochemical Impedance Spectroscopy

Abstract

Local\nelectrochemical impedance spectroscopy (LEIS) has been a\nversatile technology for characterizing local complex electrochemical\nprocesses at heterogeneous surfaces. However, further application\nof this technology is restricted by its poor spatial resolution. In\nthis work, high-spatial-resolution LEIS was realized using scanning\nelectrochemical cell microscopy (SECCM-LEIS). The spatial resolution\nwas proven to be ∼180 nm based on experimental and simulation\nresults. The stability and reliability of this platform were further\nverified by long-term tests and Kramers–Kronig transformation.\nWith this technology, larger electric double-layer capacitance (<i>C</i>_dl) and smaller interfacial resistance (<i>R</i>_t) were observed at the edges of N-doped reduced\ngraphene oxide, as compared to those at the planar surface, which\nmay be due to the high electrochemical activity at the edges. The\nestablished SECCM-LEIS provides a high-spatial approach for study\nof the interfacial electrochemical behavior of materials, which can\ncontribute to the elucidation of the electrochemical reaction mechanism\nat material surfaces.