Redox-probe-free scanning electrochemical microscopy combined with fast Fourier transform electrochemical impedance spectroscopy

Aušra Valiūnienė; Jūratė Jolanta Petronienė; Inga Morkvėnaitė-Vilkončienė; Georgi Popkirov; Almira Ramanavičienė; Arūnas Ramanavičius

doi:10.1039/c9cp00187e

JOURNAL ARTICLE

Redox-probe-free scanning electrochemical microscopy combined with fast Fourier transform electrochemical impedance spectroscopy

Aušra Valiūnienė Jūratė Jolanta Petronienė Inga Morkvėnaitė-Vilkončienė Georgi Popkirov Almira Ramanavičienė Arūnas Ramanavičius

Year: 2019 Journal: Physical Chemistry Chemical Physics Vol: 21 (19)Pages: 9831-9836 Publisher: Royal Society of Chemistry

DOI: 10.1039/c9cp00187e

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Abstract

Scanning electrochemical microscopy (SECM) hybridized with fast Fourier transform-based electrochemical impedance spectroscopy (FFT-EIS) seems to be a powerful variation of scanning electrochemical impedance microscopy (SEIM).

Keywords:

Dielectric spectroscopy Scanning electrochemical microscopy Electrochemistry Fourier transform infrared spectroscopy Analytical Chemistry (journal) Redox Microscopy Materials science Fourier transform Fourier transform spectroscopy Electrical impedance Spectroscopy Scanning probe microscopy Chemistry Chemical engineering Nanotechnology Inorganic chemistry Electrode Optics Physical chemistry Organic chemistry Physics

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Electrochemical Analysis and Applications

Physical Sciences → Chemistry → Electrochemistry

Analytical Chemistry and Sensors

Physical Sciences → Chemical Engineering → Bioengineering

Corrosion Behavior and Inhibition

Physical Sciences → Materials Science → Materials Chemistry

Redox-probe-free scanning electrochemical microscopy combined with fast Fourier transform electrochemical impedance spectroscopy

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