Takashi Yanase (2862962)Sho Watanabe (728293)Mengting Weng (1709221)Makoto Wakeshima (1507057)Yukio Hinatsu (1483456)Taro Nagahama (2862965)Toshihiro Shimada (2862968)
This article reports\nthe growth and characterization of <i>c</i>-axis-oriented\nNbS<sub>2</sub> thin films on SiO<sub>2</sub>/Si substrate by ambient\npressure chemical vapor deposition (CVD)\nusing a generic metal chloride source. We found that NbS<sub>2</sub> nanosheets can be grown directly on the SiO<sub>2</sub>/Si substrate\nwith the aid of hydrogen gas mixed in the carrier gas. Detailed examination\nof the growth parameters was made possible using a separate-flow CVD\napparatus. It appears that the major cause of the misorientation is\nthe off-stoichiometry with surplus Nb. The quality of the films was\nevaluated by X-ray diffraction and Raman spectroscopy as well as resistivity\nmeasurements at low temperatures. They showed a resistivity minimum\nat the same temperature of the charge density wave (CDW) transition\nfor a bulk single crystal of 3R-NbS<sub>2</sub>.
Takashi YanaseShinya WatanabeMengting WengTaro NagahamaTadashi Shimada
Qiao Mu LiuLi Tong ZhangZhi Xin MengLaifei Cheng
Chiara Massera (547887)Gernot Frenking (1569796)
Sevilay Demi̇rci̇ (2828537)Vedat Adıgüzel (2828534)Ömer Şahi̇n (2828531)
Hai Tao XiaYu Fen LiuDe Fu Rong