JOURNAL ARTICLE

SiPT: Signature-Based Predictive Testing of RRAM Crossbar Arrays for Deep Neural Networks

Kwondo MaAnurup SahaChandramouli AmarnathAbhijit Chatterjee

Year: 2025 Journal:   IEEE Transactions on Emerging Topics in Computing Vol: 13 (4)Pages: 1465-1480   Publisher: Institute of Electrical and Electronics Engineers
Keywords:
Computer science Resistive random-access memory Signature (topology) Crossbar switch Artificial neural network Deep learning Artificial intelligence Telecommunications Electrical engineering Engineering

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Topics

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Physical Sciences →  Engineering →  Electrical and Electronic Engineering
VLSI and Analog Circuit Testing
Physical Sciences →  Computer Science →  Hardware and Architecture
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Physical Sciences →  Computer Science →  Artificial Intelligence
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