SiPT: Signature-Based Predictive Testing of RRAM Crossbar Arrays for Deep Neural Networks

Kwondo Ma; Anurup Saha; Chandramouli Amarnath; Abhijit Chatterjee

doi:10.1109/tetc.2025.3533895

ScienceGate Book Chapters

JOURNAL ARTICLE

SiPT: Signature-Based Predictive Testing of RRAM Crossbar Arrays for Deep Neural Networks

Kwondo Ma Anurup Saha Chandramouli Amarnath Abhijit Chatterjee

Year: 2025 Journal: IEEE Transactions on Emerging Topics in Computing Vol: 13 (4)Pages: 1465-1480 Publisher: Institute of Electrical and Electronics Engineers

DOI: 10.1109/tetc.2025.3533895

Get Full-Text PDF Get Analytical Report

Keywords:

Computer science Resistive random-access memory Signature (topology) Crossbar switch Artificial neural network Deep learning Artificial intelligence Telecommunications Electrical engineering Engineering

Metrics

Cited By

2.02

FWCI (Field Weighted Citation Impact)

Refs

0.71

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

Adversarial Robustness in Machine Learning

Physical Sciences → Computer Science → Artificial Intelligence

SiPT: Signature-Based Predictive Testing of RRAM Crossbar Arrays for Deep Neural Networks

Metrics

Citation History

Topics

Related Documents

RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs)

Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks

Implementation of ultra-low-power neural networks on quantized and pruned RRAM crossbar arrays

Neuromorphic Accelerator for Deep Spiking Neural Networks with NVM Crossbar Arrays

ITT-RNA: Imperfection Tolerable Training for RRAM-Crossbar-Based Deep Neural-Network Accelerator