JOURNAL ARTICLE

RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs)

Abstract

Computation-In Memory (CIM) using RRAM crossbar array is a promising solution to realize energy-efficient neuromorphic hardware, such as Binary Neural Networks (BNNs). However, RRAM faults restrict the applicability of CIM for BNN implementation. To address this issue, we propose a fault tolerance framework to mitigate the impact of RRAM faults on the accuracy of CIM-based BNN hardware. Evaluation results using MNIST, Fashion-MNIST and CIFAR-10 datasets demonstrate that the proposed framework outperforms the related works as it restores more than 99% of the RRAM fault induced accuracy reduction with relatively less overhead.

Keywords:
MNIST database Neuromorphic engineering Crossbar switch Resistive random-access memory Overhead (engineering) Computer science Fault tolerance Artificial neural network Binary number Memristor Parallel computing Non-volatile memory Efficient energy use Computer architecture Computer engineering Embedded system Artificial intelligence Distributed computing Computer hardware Electronic engineering Voltage Engineering Operating system Electrical engineering Arithmetic

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6
Cited By
0.65
FWCI (Field Weighted Citation Impact)
18
Refs
0.64
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Citation History

Topics

Advanced Memory and Neural Computing
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Ferroelectric and Negative Capacitance Devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Neuroscience and Neural Engineering
Life Sciences →  Neuroscience →  Cellular and Molecular Neuroscience
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