BOOK-CHAPTER
Repeatability of Automated Edge Coupling for Wafer Level Testing
Anna PęczekTino MinnerQuan YuanChristian MaiDan RishavyLars Zimmermann
Year: 2024 Springer proceedings in physics Pages: 71-75 Publisher: Springer Nature
Keywords:
Repeatability Wafer Enhanced Data Rates for GSM Evolution Materials science Coupling (piping) Reliability engineering Computer science Optoelectronics Composite material Engineering Mathematics Statistics Artificial intelligence
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Topics
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences → Engineering → Electrical and Electronic Engineering
Industrial Vision Systems and Defect Detection
Physical Sciences → Engineering → Industrial and Manufacturing Engineering
Advancements in Photolithography Techniques
Physical Sciences → Engineering → Electrical and Electronic Engineering
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