Patch-guided point matching for point cloud registration with low overlap

Tianming Zhao; Linfeng Li; Tian Tian; Jiayi Ma; Jinwen Tian

doi:10.1016/j.patcog.2023.109876

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Patch-guided point matching for point cloud registration with low overlap

Tianming Zhao Linfeng Li Tian Tian Jiayi Ma Jinwen Tian

Year: 2023 Journal: Pattern Recognition Vol: 144 Pages: 109876-109876 Publisher: Elsevier BV

DOI: 10.1016/j.patcog.2023.109876

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Keywords:

Point cloud Point set registration Matching (statistics) Computer science Outlier Point (geometry) Context (archaeology) Artificial intelligence Feature (linguistics) Pattern recognition (psychology) Shape context Consistency (knowledge bases) Mathematics Statistics Image (mathematics) Geometry Geography

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3D Shape Modeling and Analysis

Physical Sciences → Engineering → Computational Mechanics

3D Surveying and Cultural Heritage

Physical Sciences → Earth and Planetary Sciences → Geology

Robotics and Sensor-Based Localization

Physical Sciences → Engineering → Aerospace Engineering

Patch-guided point matching for point cloud registration with low overlap

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