JOURNAL ARTICLE

Removal of silicon-containing contaminants from TEM specimens

Dongsheng He

Year: 2023 Journal:   Ultramicroscopy Vol: 253 Pages: 113797-113797   Publisher: Elsevier BV
Keywords:
Silicon Contamination Electron microscope Materials science Transmission electron microscopy Environmental chemistry Nanotechnology Analytical Chemistry (journal) Chemistry Metallurgy Optics Physics

Metrics

13
Cited By
6.35
FWCI (Field Weighted Citation Impact)
19
Refs
0.94
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Electron Microscopy Techniques and Applications
Life Sciences →  Biochemistry, Genetics and Molecular Biology →  Structural Biology
Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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