Automatic concolic test generation with virtual prototypes for post-silicon validation

Abstract

Post-silicon validation is a crucial stage in the system development cycle. To accelerate post-silicon validation, high-quality tests should be ready before the first silicon prototype becomes available. In this paper, we present a concolic testing approach to generation of post-silicon tests with virtual prototypes. We identify device states under test from concrete executions of a virtual prototype based on the concept of device transaction, symbolically execute the virtual prototype from these device states to generate tests, and issue the generated tests concretely to the silicon device. We have applied this approach to virtual prototypes of three network adapters to generate their tests. The generated test cases have been issued to both virtual prototypes and silicon devices. We observed significant coverage improvement with generated test cases. Furthermore, we detected 20 inconsistencies between virtual prototypes and silicon devices, each of which reveals a virtual prototype or silicon device defect.