JOURNAL ARTICLE
Failure Analysis of Single and Dual nc-ITO Embedded ZrHfO High-k Nonvolatile Memories
Chia-Han YangYue KuoChen-Han Lin
Year: 2009 Journal: ECS Meeting Abstracts Vol: MA2009-02 (25)Pages: 2152-2152 Publisher: Institute of Physics
Abstract
Abstract not Available.
Keywords:
Dual (grammatical number) Non-volatile memory Computer science Computer hardware Art
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Topics
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
Ferroelectric and Negative Capacitance Devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
Advanced Memory and Neural Computing
Physical Sciences → Engineering → Electrical and Electronic Engineering
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