JOURNAL ARTICLE
Light Effects on Charge Trapping and Detrapping of nc-ZnO Embedded ZrHfO High-k MOS Nonvolatile Memories
Bingqing LuoChen-Han LinYue Kuo
Year: 2011 Journal: ECS Meeting Abstracts Vol: MA2011-02 (27)Pages: 1889-1889 Publisher: Institute of Physics
Abstract
Abstract not Available.
Keywords:
Trapping Optoelectronics Charge (physics) Non-volatile memory Materials science Physics
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Topics
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
Advanced Memory and Neural Computing
Physical Sciences → Engineering → Electrical and Electronic Engineering
Electronic and Structural Properties of Oxides
Physical Sciences → Materials Science → Materials Chemistry
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