Flash sintering of yttria‐stabilized zirconia powders coated with nanoscale films of alumina by atomic layer deposition

Abstract

Abstract The addition of small quantities of aluminum oxide (Al 2 O 3 ) to 8 mol% yttria‐stabilized zirconia (8YSZ) benefits conventional sintering by acting as a sintering aid and altering grain growth behavior. However, it is uncertain if these benefits observed during conventional sintering extend to flash sintering. In this work, nanoscale films of Al 2 O 3 are deposited on 8YSZ powders by particle atomic layer deposition (ALD). The ALD‐coated powders were flash sintered using voltage‐to‐current control and current rate experiments. The sintering behavior, microstructural evolution, and ionic conductivities were characterized. The addition of Al 2 O 3 films changed the conductivity of the starting powder, effectively moving the flash onset temperature. The grain size of the samples flashed with current rate experiments was ~65% smaller than that of conventionally sintered samples. Measurement of grain size and estimates of sample density as a function of temperature during flash sintering showed that small quantities of Al 2 O 3 can enhance grain growth and sintering of 8YSZ. This suggests that Al 2 O 3 dissolves into the 8YSZ grain boundaries during flash sintering to form complexions that enhance the diffusion of species controlling these processes.