Abstract

Due to the excellent feature learning and representation capabilities of deep learning, the method based on deep learning for mobile phone screen defect detection is gradually being applied to industrial detection. Nowadays, the cross-entropy loss commonly used in deep learning only focuses on the d

Keywords:
Deep learning Mobile phone Computer science Artificial intelligence Feature learning Phone Representation (politics) Feature (linguistics) Function (biology) Feature extraction Machine learning Telecommunications

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Topics

Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering
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