Due to the excellent feature learning and representation capabilities of deep learning, the method based on deep learning for mobile phone screen defect detection is gradually being applied to industrial detection. Nowadays, the cross-entropy loss commonly used in deep learning only focuses on the d
Peng ShiXueqin LiZhiming FengXiaoqing Shang
Jianguo ZhangYing LiChunmei ZuoMingxing Xing
ZHOU Siyu, XU Huiying, ZHU Xinzhong, HUANG Xiao, SHENG Ke, CAO Yuqi, CHEN Chen
Meiju LiuZhuang RuiXifeng GuoZhao Junrui
Yongfeng ZhouShanxin ZhangLinbo Xie