Mobile Phone Screen Defect Detection Algorithm Based on Improved YOLOv8n: PGS-YOLO

Abstract

As the main window of human-computer interaction, the mobile phone screen has become an important factor affecting the user experience and the overall performance of the terminal. As a result, there is a growing demand to address defects in mobile phone screens. To meet this demand, in view of the low detection accuracy, high missed detection rate of small target defects, and slow detection speed in the process of defect detection on mobile phone screens, a PGS-YOLO algorithm is proposed, with YOLOv8n as the benchmark model. PGS-YOLO effectively improves the detection ability of small targets by adding a special small target detection head and combining it with the SeaAttention attention module. The backbone and feature fusion networks are integrated into PConv and GhostNetV2 lightweight modules, respectively, to ensure accuracy, reduce the number of model parameters, and improve the speed and efficiency of defect detection. The experimental results show that, in the dataset of mobile phone screen surface defects from Peking University, compared with the results of YOLOv8n, the [email protected] and [email protected]∶0.95 of the PGS-YOLO algorithm are increased by 2.5 and 2.2 percentage points, respectively. The algorithm can accurately detect large defects in the process of mobile phone screen defect detection as well as maintain a certain degree of accuracy for small defects. In addition, the detection performance is better than that of most YOLO series algorithms, such as YOLOv5n and YOLOv8s. Simultaneously, the number of parameters is only 2.0×10⁶, which is smaller than that of YOLOv8n, meeting the needs of industrial scenarios for mobile phone screen defect detection.