This is the author accepted manuscript. The final version is available from IEEE via the DOI in this record
Nigel ReesNeil VaughanThomas W. DayKeith DorringtonLloyd Frederic ReesNigel W. John
Jeffrey PurseKimberley J. DavisHina Patel
Rolf ZieglerGeorg FischerWolfgang MüllerMartin Göbel