Abstract The dielectric, electrical, and structural properties of oxide films prepared by anodization of Al films which are covered with thin sputtered aluminum oxide layers are compared with oxide films fabricated by either anodization or sputtering.
Fabian PatrovskyVera FiehlerSusan DerenkoS. BarthHagen BartzschKatrin OrtsteinPeter FrachLukas M. Eng
John R. DickeyJ.L. DavidsonYonhua Tzeng