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BOOK-CHAPTER
Coverage Evaluation and Analysis of Post-Silicon Tests with Virtual Prototypes
Kai Cong
Fei Xie
Year:
2018
Pages:
275-306
DOI:
10.1007/978-3-319-98116-1_14
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Keywords:
Computer science
Debugging
Silicon
Metric (unit)
Reliability engineering
Database transaction
Embedded system
Operating system
Database
Engineering
Metrics
0
Cited By
0.00
FWCI (Field Weighted Citation Impact)
18
Refs
0.12
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Software Testing and Debugging Techniques
Physical Sciences → Computer Science → Software
VLSI and Analog Circuit Testing
Physical Sciences → Computer Science → Hardware and Architecture
Radiation Effects in Electronics
Physical Sciences → Engineering → Electrical and Electronic Engineering
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