JOURNAL ARTICLE

Optical properties of YbF3-CaF2 composite thin films deposited by electron-beam evaporation

Abstract

We studied electron-beam evaporated YbF3-CaF2 composite films on ZnS substrate at different deposition parameters. The optical properties of films have been fitted, the surface roughness have been measured by AFM. The results of experiments indicated that increased the refractive indices, extinction coefficients, and surface roughness at higher deposition rate. The refractive index of composite film deposited by electron-beam evaporation with assisted-ion source was obviously higher than it without assisted-ion source.

Keywords:
Electron beam physical vapor deposition Materials science Refractive index Evaporation Surface roughness Deposition (geology) Thin film Substrate (aquarium) Ion beam-assisted deposition Composite number Surface finish Analytical Chemistry (journal) Ion beam Optics Extinction (optical mineralogy) Beam (structure) Composite material Optoelectronics Nanotechnology Chemistry

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Topics

Optical Coatings and Gratings
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics
Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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