Optical properties of erbium oxide thin films deposited by electron beam evaporation

M.F. Al-Kuhaili; S.M.A. Durrani

doi:10.1016/j.tsf.2006.08.048

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Optical properties of erbium oxide thin films deposited by electron beam evaporation

M.F. Al-Kuhaili S.M.A. Durrani

Year: 2006 Journal: Thin Solid Films Vol: 515 (5)Pages: 2885-2890 Publisher: Elsevier BV

DOI: 10.1016/j.tsf.2006.08.048

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Keywords:

Transmittance Thin film Materials science Electron beam physical vapor deposition X-ray photoelectron spectroscopy Amorphous solid Molar absorptivity Analytical Chemistry (journal) Evaporation Refractive index Optics Oxide Chemistry Optoelectronics Crystallography Nanotechnology Nuclear magnetic resonance

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Surface Roughness and Optical Measurements

Physical Sciences → Engineering → Computational Mechanics

Optical properties of erbium oxide thin films deposited by electron beam evaporation

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