Electronic structure of Cr doped Fe 3 O 4 thin films by X-ray absorption near-edge structure spectroscopy

Chi‐Liang Chen; Chung‐Li Dong; K. Asokan; G. Chern; C. L. Chang

doi:10.1016/j.ssc.2018.01.011

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Electronic structure of Cr doped Fe 3 O 4 thin films by X-ray absorption near-edge structure spectroscopy

Chi‐Liang Chen Chung‐Li Dong K. Asokan G. Chern C. L. Chang

Year: 2018 Journal: Solid State Communications Vol: 272 Pages: 48-52 Publisher: Elsevier BV

DOI: 10.1016/j.ssc.2018.01.011

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Keywords:

XANES Valence (chemistry) Dopant Doping Crystal structure Electronic structure Thin film Ion Absorption spectroscopy Crystallography Materials science Chemistry Analytical Chemistry (journal) Spectroscopy Nanotechnology Optoelectronics Optics Computational chemistry

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Magnetic Properties and Synthesis of Ferrites

Physical Sciences → Materials Science → Materials Chemistry

Magnetic properties of thin films

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Advancements in Battery Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Electronic structure of Cr doped Fe 3 O 4 thin films by X-ray absorption near-edge structure spectroscopy

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