Local electronic structure of phosphorus-doped ZnO films investigated by X-ray absorption near-edge spectroscopy

V. Vaithianathan; K. Asokan; Jae Young Park; Sang Sub Kim

doi:10.1007/s00339-008-4883-6

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Local electronic structure of phosphorus-doped ZnO films investigated by X-ray absorption near-edge spectroscopy

V. Vaithianathan K. Asokan Jae Young Park Sang Sub Kim

Year: 2008 Journal: Applied Physics A Vol: 94 (4)Pages: 995-998 Publisher: Springer Science+Business Media

DOI: 10.1007/s00339-008-4883-6

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Keywords:

XANES Valence (chemistry) Doping Absorption spectroscopy Analytical Chemistry (journal) Spectroscopy Annealing (glass) Electronic structure Ion Spectral line X-ray photoelectron spectroscopy Chemistry Crystallography X-ray absorption spectroscopy Materials science Nuclear magnetic resonance Optics Optoelectronics Physics

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ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

Gas Sensing Nanomaterials and Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Local electronic structure of phosphorus-doped ZnO films investigated by X-ray absorption near-edge spectroscopy

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