Investigation of influence of measurement conditions on accuracy of material characterization in sub-THz frequency range

Abstract

In this paper results of investigations of the influence of measurement conditions on the accuracy of material characterization in sub-THz range were presented. Different fabrication issues as well as metrological aspects were taken into account. Studies were focused on LTCC materials as emerging technology that can be used in developing of multilayer sub-terahertz devices. Simulation and experimental studies showed that appropriate preparation of measurement setup and samples under test are key elements to achieve high measurement accuracy.