Accuracy enhancement of material characterization in sub-THz range

Przemysław Piasecki; Konrad Godziszewski; Yevhen Yashchyshyn

doi:10.1109/mikon.2014.6900001

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Accuracy enhancement of material characterization in sub-THz range

Przemysław Piasecki Konrad Godziszewski Yevhen Yashchyshyn

Year: 2014 Pages: 1-4

DOI: 10.1109/mikon.2014.6900001

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Abstract

In this paper many aspects of material characterization in sub-THz frequency range are shown. Methods of reducing unwanted reflections from construction of the measurement setup and from the sample under test are proposed. The influence of lens tilt on electromagnetic field distribution in location of the sample is investigated.

Keywords:

Characterization (materials science) Tilt (camera) Terahertz radiation Range (aeronautics) Sample (material) Materials science Optics Field (mathematics) Lens (geology) Measurement uncertainty Optoelectronics Physics Engineering Mechanical engineering

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Terahertz technology and applications

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Acoustic Wave Resonator Technologies

Physical Sciences → Engineering → Biomedical Engineering

Accuracy enhancement of material characterization in sub-THz range

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