Local reflectance spectra measurements of surfaces using coherence scanning interferometry

Rémy Claveau; Paul Montgomery; Manuel Flury; D. Montaner

doi:10.1117/12.2227625

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Local reflectance spectra measurements of surfaces using coherence scanning interferometry

Rémy Claveau Paul Montgomery Manuel Flury D. Montaner

Year: 2016 Journal: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 9890 Pages: 98900Q-98900Q Publisher: SPIE

DOI: 10.1117/12.2227625

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Abstract

International audience

Keywords:

Optics Interferometry Interference (communication) Materials science White light interferometry Michelson interferometer SIGNAL (programming language) Wavelength Coherence (philosophical gambling strategy) Spectral line Physics Channel (broadcasting)

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Topics

Optical Coherence Tomography Applications

Physical Sciences → Engineering → Biomedical Engineering

Optical measurement and interference techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Surface Roughness and Optical Measurements

Physical Sciences → Engineering → Computational Mechanics

Local reflectance spectra measurements of surfaces using coherence scanning interferometry

Abstract

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Citation History

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