JOURNAL ARTICLE

Phase-shifting interferometry: measurements with high-reflectance surfaces

Parameswaran Hariharan

Year: 2002 Journal:   Optical Engineering Vol: 41 (4)Pages: 856-856   Publisher: SPIE

Abstract

With a phase-shifting Fizeau interferometer, problems arise in making accurate measurements of nominally flat optical surfaces with high-reflectance coatings. We describe a simple technique that can be used to make accurate measurements of such surfaces.

Keywords:
Interferometry Reflectivity Optics Remote sensing Optical engineering Phase (matter) Computer science Materials science Geology Physics

Metrics

3
Cited By
0.68
FWCI (Field Weighted Citation Impact)
15
Refs
0.68
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advanced Measurement and Metrology Techniques
Physical Sciences →  Engineering →  Mechanical Engineering
Surface Roughness and Optical Measurements
Physical Sciences →  Engineering →  Computational Mechanics

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BOOK-CHAPTER

Phase-Shifting Interferometry

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