JOURNAL ARTICLE

The Electronic Properties of Silicon-Silicide Epitaxial Interfaces

Stefano OssiciniO. Bisi

Year: 1987 Journal:   MRS Proceedings Vol: 102   Publisher: Cambridge University Press
Keywords:
Materials science Epitaxy Silicide Schottky barrier Silicon Interface (matter) Condensed matter physics Optoelectronics Engineering physics Nanotechnology Composite material Layer (electronics) Physics

Metrics

2
Cited By
0.44
FWCI (Field Weighted Citation Impact)
12
Refs
0.62
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Intermetallics and Advanced Alloy Properties
Physical Sciences →  Engineering →  Mechanical Engineering

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