JOURNAL ARTICLE

Microstructure and the Urbach Edge in Glow Discharge Deposited a-SiC:H

Keywords:
Microstructure Materials science Raman spectroscopy Raman scattering Glow discharge Infrared Analytical Chemistry (journal) Composite material Optics Plasma

Metrics

20
Cited By
3.11
FWCI (Field Weighted Citation Impact)
15
Refs
0.93
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon Carbide Semiconductor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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