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Motif-based method for patterned texture defect detection
Henry Ngan Yuk-tung
Year:
2008
DOI:
10.5353/th_b4020360
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Keywords:
Motif (music)
Computer science
Artificial intelligence
Materials science
Art
Aesthetics
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FWCI (Field Weighted Citation Impact)
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Topics
Industrial Vision Systems and Defect Detection
Physical Sciences → Engineering → Industrial and Manufacturing Engineering
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