JOURNAL ARTICLE
Motif-based defect detection for patterned fabric
Henry Y. T. NganG.K.H. PangN.H.C. Yung
Year: 2007 Journal: Pattern Recognition Vol: 41 (6)Pages: 1878-1894 Publisher: Elsevier BV
Keywords:
Subtraction Motif (music) Computer science Mathematics Artificial intelligence Pattern recognition (psychology) Algorithm Arithmetic Physics
Metrics
65
Cited By
3.24
FWCI (Field Weighted Citation Impact)
50
Refs
0.91
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Industrial Vision Systems and Defect Detection
Physical Sciences → Engineering → Industrial and Manufacturing Engineering
Surface Roughness and Optical Measurements
Physical Sciences → Engineering → Computational Mechanics
Optical measurement and interference techniques
Physical Sciences → Computer Science → Computer Vision and Pattern Recognition
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