Measuring optical anisotropy in poly(3,4-ethylene dioxythiophene):poly(styrene sulfonate) films with added graphene

Tommi Isoniemi; Sampo Tuukkanen; David Cameron; Janne Simonen; J. Jussi Toppari

doi:10.1016/j.orgel.2015.06.037

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Measuring optical anisotropy in poly(3,4-ethylene dioxythiophene):poly(styrene sulfonate) films with added graphene

Tommi Isoniemi Sampo Tuukkanen David Cameron Janne Simonen J. Jussi Toppari

Year: 2015 Journal: Organic Electronics Vol: 25 Pages: 317-323 Publisher: Elsevier BV

DOI: 10.1016/j.orgel.2015.06.037

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Keywords:

Materials science PEDOT:PSS Graphene Conductive polymer Spin coating Ellipsometry Anisotropy Nanotechnology Optoelectronics Thin film Polymer Composite material Optics

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Graphene research and applications

Physical Sciences → Materials Science → Materials Chemistry

Advanced Sensor and Energy Harvesting Materials

Physical Sciences → Engineering → Biomedical Engineering

Conducting polymers and applications

Physical Sciences → Materials Science → Polymers and Plastics

Measuring optical anisotropy in poly(3,4-ethylene dioxythiophene):poly(styrene sulfonate) films with added graphene

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