Direct laser interference patterning of poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDOT-PSS) thin films

Andrés Fabián Lasagni; Jeffrey L. Hendricks; Charles M. Shaw; Dajun Yuan; David C. Martin; Suman Das

doi:10.1016/j.apsusc.2009.06.130

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Direct laser interference patterning of poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDOT-PSS) thin films

Andrés Fabián Lasagni Jeffrey L. Hendricks Charles M. Shaw Dajun Yuan David C. Martin Suman Das

Year: 2009 Journal: Applied Surface Science Vol: 255 (22)Pages: 9186-9192 Publisher: Elsevier BV

DOI: 10.1016/j.apsusc.2009.06.130

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Keywords:

Materials science PEDOT:PSS Thin film Laser ablation Fluence Optoelectronics Polymer Nanotechnology Chemical engineering Laser Composite material Optics

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Laser Material Processing Techniques

Physical Sciences → Engineering → Computational Mechanics

Surface Roughness and Optical Measurements

Physical Sciences → Engineering → Computational Mechanics

Adhesion, Friction, and Surface Interactions

Physical Sciences → Engineering → Mechanics of Materials

Direct laser interference patterning of poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDOT-PSS) thin films

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