Monte Carlo Comparison Between InP-Based Double-Gate and Standard HEMTs

Abstract

The intrinsic static and dynamic performance of InAlAs/InGaAs double-gate high electron mobility transistors (DG-HEMTs) is studied by means of an ensemble 2D Monte Carlo simulator. Our model allows going deeply into the physical behavior of this novel device in comparison with similar standard HEMTs. Different gate lengths are analyzed in order to check the attenuation of short-channel effects expected in the DG-structures. The intrinsic cut-off frequency f _c of the DG-HEMTs is found to be similar to that of HEMTs, but the higher values of the figures of merit g _m /g _d and C _gs /C _gd lead to an improvement of f _max