JOURNAL ARTICLE

ZnSe-based Schottky barrier photodetectors

F. ViguéE. TourniéJ. P. Faurie

Year: 2000 Journal:   Electronics Letters Vol: 36 (4)Pages: 352-354   Publisher: Institution of Engineering and Technology

Abstract

Vertical geometry photodetectors based on n–/n+-ZnSe structures grown on semi-insulating GaAs (001) substrates by molecular beam epitaxy have been realised. A semi-transparent bilayer (Ni (50 Å)-Au (50 Å)) was used to form the Schottky contact. The current-voltage characteristics show that the devices have an ideality factor of 1.1, a barrier height of 1.17 eV and a low dark current density of ~10-8 A/cm2 at –4 V bias. These photodetectors have a flat responsivity above the bandgap (measured to be 0.1 A/W) and a sharp cutoff at the band edge (460 nm) of 3 – 4 orders of magnitude.

Keywords:
Photodetector Responsivity Schottky barrier Molecular beam epitaxy Optoelectronics Dark current Materials science Band gap Schottky diode Bilayer Cutoff frequency Enhanced Data Rates for GSM Evolution Optics Epitaxy Diode Layer (electronics) Physics Chemistry Nanotechnology

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21
Cited By
1.19
FWCI (Field Weighted Citation Impact)
4
Refs
0.81
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

GaN-based semiconductor devices and materials
Physical Sciences →  Physics and Astronomy →  Condensed Matter Physics
Semiconductor Quantum Structures and Devices
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Nanowire Synthesis and Applications
Physical Sciences →  Engineering →  Biomedical Engineering

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