JOURNAL ARTICLE

Growth of ZnSe epilayers on Fe(001) films by migration enhanced epitaxy and self-limiting epitaxy

H. AbadB. T. JonkerC. M. CotellJ. J. Krebs

Year: 1995 Journal:   Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Vol: 13 (2)Pages: 716-719   Publisher: American Institute of Physics

Abstract

Low temperature growth of ZnSe epilayers on Fe (001) films using migration enhanced epitaxy (MEE) and self-limiting epitaxy (SLE) and the growth of Fe/ZnSe/Fe multilayers is reported. All samples were grown on GaAs (001) substrates. The samples were characterized in situ by reflection high energy electron diffraction and ex situ using magnetic and transmission electron microscopy measurements. Under Zn-rich conditions, MEE and SLE preserve the magnetic character of the incorporated Fe film. In Fe/ZnSe/Fe structures, the Fe films have significantly different coercive fields and resonant linewidths which may be related to the difference in defect densities between the two layers.

Keywords:
Epitaxy Transmission electron microscopy Materials science Limiting Electron diffraction Reflection (computer programming) Diffraction Reflection high-energy electron diffraction Optoelectronics Analytical Chemistry (journal) Condensed matter physics Crystallography Chemistry Optics Nanotechnology Layer (electronics)

Metrics

6
Cited By
0.22
FWCI (Field Weighted Citation Impact)
0
Refs
0.53
Citation Normalized Percentile
Is in top 1%
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Topics

Magnetic properties of thin films
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

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