JOURNAL ARTICLE

Three-dimensional electron-beam lithography simulation

Chris A. Mack

Year: 1997 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 3048 Pages: 76-76   Publisher: SPIE

Abstract

A new model called ProBEAM/3D is introduced for the simulation of electron beam lithography. Monte Carlo simulations are combined with a beam shape to generate a single 'pixel' energy distribution. This pixel is then used to write a pattern by controlling the dose of every pixel on an address grid. The resulting dose pattern is used to expose and develop a resist to form a three-dimensional resist pattern.

Keywords:
Resist Electron-beam lithography Lithography Pixel Monte Carlo method Optics X-ray lithography Cathode ray Beam (structure) Stencil lithography Grid Electron Materials science Physics Nanotechnology

Metrics

15
Cited By
4.10
FWCI (Field Weighted Citation Impact)
12
Refs
0.95
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advancements in Photolithography Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Nanofabrication and Lithography Techniques
Physical Sciences →  Engineering →  Biomedical Engineering

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