JOURNAL ARTICLE

Metrological Characterisation of a Time of Flight CMOS Range Image Sensor

Abstract

This paper presents a metrological characterisation of an indirect time of flight (ITOF) CMOS range image sensor. A number of experiments were performed to measure the actual performance of the system under test and to highlight its strength and weak points, with a focus on which limits are related to the design and which are intrinsic in the operating principle. The proposed system allows repeatable and accurate measurements but pixel-level calibration is needed to achieve high accuracy over the whole frame. The averaging process required to improve the signal-to-noise ratio of the acquired signal, reduces the potential use in real-time operations, especially at distances greater than 1.5 m or with low-reflective targets.

Keywords:
Metrology Image sensor Calibration Pixel CMOS SIGNAL (programming language) Computer science Frame (networking) Electronic engineering Measure (data warehouse) CMOS sensor Noise (video) Range (aeronautics) Focus (optics) Time delay and integration Signal-to-noise ratio (imaging) Process (computing) Artificial intelligence Computer vision Image (mathematics) Engineering Optics Physics Telecommunications

Metrics

3
Cited By
1.90
FWCI (Field Weighted Citation Impact)
12
Refs
0.92
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Optical Sensing Technologies
Physical Sciences →  Physics and Astronomy →  Instrumentation
CCD and CMOS Imaging Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Analytical Chemistry and Sensors
Physical Sciences →  Chemical Engineering →  Bioengineering

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