JOURNAL ARTICLE

Accuracy Performance of a Time-of-Flight CMOS Range Image Sensor System

Francesco LeonardiD. CoviDario PetriDavid Stoppa

Year: 2009 Journal:   IEEE Transactions on Instrumentation and Measurement Vol: 58 (5)Pages: 1563-1570   Publisher: Institute of Electrical and Electronics Engineers

Abstract

This paper analyzes the performance of an indirect time-of-flight (ITOF) complementary metal-oxide semiconductor (CMOS) range image sensor. A number of experiments were performed to measure the actual performance of the system under test and to highlight its strength and weak points, with a focus on which limits are related to the design and which are intrinsic in the operating principle. The evaluated system allows fast and accurate measurements, but pixel-level calibration is needed to achieve high accuracy over the whole image. Simple temporal or spatial filtering allows a significant reduction in the measurement uncertainty.

Keywords:
CMOS Image sensor Pixel Calibration Computer science Electronic engineering Range (aeronautics) CMOS sensor Measure (data warehouse) Dynamic range Artificial intelligence Computer vision Engineering Mathematics

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12
Cited By
3.38
FWCI (Field Weighted Citation Impact)
17
Refs
0.96
Citation Normalized Percentile
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Citation History

Topics

Advanced Optical Sensing Technologies
Physical Sciences →  Physics and Astronomy →  Instrumentation
CCD and CMOS Imaging Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Analytical Chemistry and Sensors
Physical Sciences →  Chemical Engineering →  Bioengineering

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